Journal Paper Journal Paper Information
Name Muhammad Ovais Akhter
Co-Authors Najam Muhammad Amin, Aurangzeb Rashid Masud
Department Electrical Engineering
Title OF Paper PVT Analysis and Behavioral Modeling of Doherty and Envelope Tracking RF ULP Power Amplifiers using 65 nm CMOS Technology
Title Of Journal Sir Syed University Research Journal of Engineering Technology
Paper Type HEC Recognized Local
Impact Factor
Start Date 2023-12-29
Pages
Issue No
Volume No
DOI https://doi.org/10.33317/ssurj.589
Paper Status Published