Journal Paper Journal Paper Information
Name Aurangzeb rashid masud, Muhammad Ovais Akhter
Co-Authors Najam Muhammad Amin
Department Electrical Engineering
Title OF Paper PVT Analysis and Behavioral Modeling of Doherty and Envelope Tracking RF ULP Power Amplifiers using 65nm CMOS Technology
Title Of Journal Sir Syed University Research Journal of Engineering Technology
Paper Type HEC Recognized Local
Impact Factor -
Start Date 2023-12-29
Pages 67-73
Issue No 2
Volume No 13
DOI https://sirsyeduniversity.edu.pk/ssurj/rj/index.php/ssurj/article/view/589
Paper Status Published